Products
ProbeLogic
has developed products with the needs of our customers in mind.
If you would like detailed information on our products and services, information
request form.
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Cantilever Probe Card
Test solutions for both single or staggered row die pad configuration
and high density devices.
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Low Leakage
Parametric Testing
Solutions for low
leakage parametic testing using robust and reliable cantilever
technology.
- P-Probe
provides test capabilities solutions to as low as 1 picoA
- F-Probe
provides test capabilities solutions to as low as 1 femtoA
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Fine Pitch Cantilever Probe Card
Test solutions for ICs with denser architecture, smaller bond pads,
reduced pad pitch, and new low-k materials.
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Vert!™ Vertical Probe Card
Test
solutions utilizing Flat Tip Buckling Beam Technology for C4, BGA, and Flip Chip devices.
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Multi-DUT Diagonal Cantilever Probe Card
Test solutions for customers who require increased throughput and
decreased test time
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M-Vert!™ Vertical Probe Card
Test solutions utilizing
Pointed Tip Buckling Beam Technology
for Memory, Micro-Controller, and other
Multi-DUT applications up to x64.
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Multi-DUT Shelf Cantilever Probe Card
Test solutions for customers who require increased throughput and
decreased test time for tighter pitch devices.
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Auto Sander
User friendly probe card maintenance tool used for probe tip cleaning
of ‘flat tip’ probe needles, including cantilever and vertical.
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G-Probe™ RF Cantilever Probe Card
Test solutions for mixed
signal devices requiring RF or data rates up to 3GHz
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Pro Aligner™ Probe Alignment Station
User friendly probe card maintenance tool used for X/Y alignment of any
type cantilever probe, including Shelf style.
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