Multi-DUT Probe Card

As the need to reduce test time and increase throughput becomes more and more of an issue for our customers, ProbeLogic has again come forward with a solution. Our Multi-DUT cantilever probe card achieves all of the goals our customers have asked of us. With the Multi-DUT probe card, we are able to test up to 60 devices at a time. In striving to offer superior customer service, we are willing to review any device to determine what can be done to increase throughput and decrease test time using ProbeLogic's Multi-DUT probe card technology.

Benefits of the Multi-DUT Probe Card

Simultaneously test up to 60 Dies/DUTs
Contact force, contact resistance, and scrub marks are consistent for each Die/DUT
Each card is custom built to probe and pattern specification
Testing temperatures up to 165ºC

In order to determine if the Multi-DUT probe card will work for your company, please check out our detailed specifications. If you would like additional information on the Multi-DUT probe card as well as our other products and services, please complete the information request form.

Back to Products